Circular dichroism of forward focusing peaks and diffraction rings in 2 π steradian Si 2p photoelectron pattern
Abstract
2 π steradian Si 2p photoelectron pattern from Si(0 0 1) surface was measured. The circular dichroism of rotational shift around the incident-light axis was observed. Shifts for the forward focusing peaks in {111} and {011} directions were inversely proportional to the distance between the emitter atom and neighboring atoms in {111} and {011} directions, respectively. These shifts correspond to the parallax in stereograph of the atomic arrangements. On the other hand, such rotational shifts were not observed in {112} directions due to the first order diffraction rings around {110} directions. A gross feature of Si 2p photoelectron pattern can be explained by forward focusing peaks and first order diffraction rings around them.
- Publication:
-
Applied Surface Science
- Pub Date:
- September 2008
- DOI:
- 10.1016/j.apsusc.2008.01.025
- Bibcode:
- 2008ApSS..254.7549I