Photopolarimetric measurement system of Mueller matrix with dual rotating waveplates
Abstract
A new photopolarimetric measurement system of Mueller matrix of optical elements is developed using dual rotating waveplates. The waveplates in polarization generator and analyzer rotate continuously with a constant ratio of revolution speed, and the Mueller matrix of a sample can be obtained in a few seconds. General principle of such measurement and the optimization of operation parameters are discussed, followed by detailed descriptions of the constructed system. Some examples of its application are also demonstrated. The system is sensitive to <10-3 for each Mueller matrix element for weak polarization elements.
- Publication:
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Publications of the National Astronomical Observatory of Japan
- Pub Date:
- 2006
- Bibcode:
- 2006PNAOJ...9...11I
- Keywords:
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- Optics;
- Polarization;
- Mueller Matrix;
- Optical Element