X-ray Raman Scattering Study of Aligned Polyfluorene
Abstract
We present a non-resonant inelastic x-ray scattering study at the carbon K-edge on aligned poly[9,9-bis(2-ethylhexyl)-fluorene-2,7-diyl] and show that the x-ray Raman scattering technique can be used as a practical alternative to x-ray absorption measurements. We demonstrate that this novel method can be applied to studies on aligned $\pi$-conjugated polymers complementing diffraction and optical studies. Combining the experimental data and a very recently proposed theoretical scheme we demonstrate a unique property of x-ray Raman scattering by performing the symmetry decomposition on the density of unoccupied electronic states into $s$- and $p$-type symmetry contributions.
- Publication:
-
Macromolecules
- Pub Date:
- December 2006
- DOI:
- 10.1021/ma060823u
- arXiv:
- arXiv:cond-mat/0608623
- Bibcode:
- 2006MaMol..39.9261G
- Keywords:
-
- Condensed Matter - Soft Condensed Matter
- E-Print:
- 19 pages, 8 figures