Differential low-coherence interferometry for in situ diagnostics of transparent structures Ivanov, V. V. ; Markelov, V. A. ; Novikov, M. A. ; Ustavshchikov, S. S. Abstract Publication: Technical Physics Letters Pub Date: May 2004 DOI: 10.1134/1.1760864 Bibcode: 2004TePhL..30..389I