Evidence for a Composite Interface State Generation Mode in the CHE-Stressed Deep-Submicrometer n-MOSFET
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- December 2004
- DOI:
- 10.1109/TED.2004.838447
- Bibcode:
- 2004ITED...51.2246A