Failure Mode Analysis of Oxide VCSELs in High Humidity and High Temperature Xie, Suning ; Herrick, Robert W. ; Chamberlin, Danielle ; Rosner, S. J. ; McHugo, Scott ; Girolami, Grant ; Mayonte, Myrna ; Kim, Seongsin ; Widjaja, Wilson Abstract Publication: Journal of Lightwave Technology Pub Date: April 2003 DOI: 10.1109/JLT.2003.809546 Bibcode: 2003JLwT...21.1013X