Near-Threshold Electron Impact Multiple Ionization of the Rare Gases
Abstract
We report the results of the experimental determination of the appearance energy values for the formation of multiply charged rare gas ions He (up to charge state n=2), Ne (n=4), Ar and Kr (n=6), and Xe (n=8) using a high-resolution electron impact ionization mass spectrometer. The data analysis uses an iterative, non-linear least-squares fitting routine in with either a 2-function or a 3-function fit based on a power threshold law. This allows the us to extract the apperance energy values and the corresponding exponents for a Wannier-type power law in the near-threshold region. A detailed comparison of our data with other measured appearance energies (incl. spectroscopic values, where available) and with other measured Wannier exponents is made as well as a comparison of our exponents with the predictions for exponents derived from various Wannier-type power law models. Work supported in part by FWF, OENB, OEAW, and NASA.
- Publication:
-
APS Annual Gaseous Electronics Meeting Abstracts
- Pub Date:
- October 2002
- Bibcode:
- 2002APS..GECQWP009G