Size dependence of non-linear optical properties of SiO2 thin films containing InP nanocrystals
Abstract
SiO2 composite thin films containing InP nanocrystals were fabricated by radio-frequency magnetron co-sputtering technique. The microstructure of the composite thin films was characterized by X-ray diffraction and Raman spectrum. The optical absorption band edges exhibit marked blueshift with respect to bulk InP due to strong quantum confinement effect. Non-linear optical absorption and non-linear optical refraction were studied by a Z-scan technique using a single Gaussian beam of a He-Ne laser (632.8 nm). We observed the saturation absorption and two-photon absorption in the composite films. An enhanced third-order non-linear optical absorption coefficient and non-linear optical refractive index were achieved in the composite films. The nonlinear optical properties of the films display the dependence on InP nanocrystals size.
- Publication:
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Applied Physics A: Materials Science & Processing
- Pub Date:
- 2001
- Bibcode:
- 2001ApPhA..73..183Z
- Keywords:
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- PACS: 78.66.-W;
- 81.15.Cd;
- 42.65.-K;
- 61.46.+W;
- 71.35.Cc