Measurement of the X-ray Raman Near Edge Structure (XRNES) Using a Point-Focusing Spatial Filter
Abstract
Non-resonant x-ray Raman scattering (XRS) is the inelastic scattering of hard x-rays from the core electrons of low-Z elements. Within certain assumptions, XRS and the better-known x-ray absorption fine structure (XAFS) are characterized by the same photoelectron transition matrix elements. Consequently, the x-ray Raman fine structure (XRFS) provides similar local structural information as soft x-ray XAFS, but with bulk rather than surface sensitivity. Whereas all previous measurements of XRFS have used bent crystal analyzers, we report here the first measurement of XRFS with a filter based analyzer. Our analyzer has an 0.3 sr collection angle, an 11energy resolution, yielding measurement times and data quality approaching those of a bent crystal analyzer. We will present XRFS results for diamond and cubic BN, then discuss other applications of the point-focusing spatial filter including fluorescence XAFS and x-ray holography.
- Publication:
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APS Northwest Section Meeting Abstracts
- Pub Date:
- May 2001
- Bibcode:
- 2001APS..NWS.B1011B