New aspects and mechanism of kink effect in static back-gate transconductance characteristics in fully-depleted SOI MOSFETs on high-dose SIMOX wafers
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- February 2000
- DOI:
- 10.1109/16.822281
- Bibcode:
- 2000ITED...47..360U