Comparison of k-resolved single-particle spectra of XRu_2Si_2, (X=Th, Ce, U)
Abstract
The k-resolved single particle excitations, as determined by angle-resolved photoemission spectroscopy (ARPES), are compared and contrasted for ThRu_2Si_2, CeRu_2Si_2, and URu_2Si_2, isostructural layered compounds with differing nominal f-occupations of f^0, f^1 and f^2, respectively. ARPES measurements include 4d and 5d-edge resonant photoemission to distinguish f-character and Fermi-edge intensity mapping of Fermi surface contours. Comparison to RLAPW band structure calculations (H. Yamagami, J. Phys. Soc. Jpn 62, 592 (1993), and private communication), show very good agreement with the d-band structure away from E_F. Discrepancies in the near EF region highlight k-dependent effects of f-correlation and f-d hybridization. Supported by the U.S. DOE at U. Mich. (DE-FG02-90ER45416) and at the Advanced Light Source (DE-AC03-76SF00098); by the U.S. NSF at U. Mich. (DMR-9971611) and at UCSD (DMR-9705454).
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2000
- Bibcode:
- 2000APS..MARI20004D