Investigation of Freestanding Polystyrene Thin Films by X-ray Scattering
Abstract
Polystyrene freestanding thin films were investigated by X-ray specular and off-specular scattering techniques. From the specular scattering, we found that the films, which have the thickness(d) > 3 times of radius of gyration(Rg), have the identical rms roughness on both outer surfaces. The diffuse scattering of those films could be explained by a power law of a simple liquid due to the capillary wave fluctuation. The vertical correlation of both surfaces of the films has also been investigated successfully. In the range of 3Rg < d < 5Rg, an anticonformal state was found. However for very thick films, a mixed mode of conformal and anticonformal structure was found. For the very thin films(d<3Rg), surprisingly a conformal structure mode dominated. Currently we are calculating curvature of surface quantitatively from the peak-broadening in diffuse scattering.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 2000
- Bibcode:
- 2000APS..MARG19010S