Domain dynamics in ferroelectric thin films imaged using apertureless near-field scanning optical microscopy
Abstract
We use apertureless near-field scanning optical microscopy (ANSOM) to examine ferroelectric thin films of Ba_1-xSr_xTiO3 with spatial resolution better than 10 nm. Structure and dynamics of ferroelectric domains are studied under changing electric fields which are applied across patterned interdigital electrodes. We present simultaneously acquired topogrpahic and ANSOM images and topographic images which show domain and grain structure of the surface as well as structure below the surface in scanning images. Hysteresis at individual points is shown by changing the field while observing a single point at the resolution of our system. Dynamic information is obtained by taking stroboscopic images using a frequency-doubled, mode-locked Ti:Sapphire laser which is synchronized (at a repetition rate of 76 MHz) to an AC electric field. We demonstrate the unique capabilities of ANSOM in examining this class of materials.
- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- March 1998
- Bibcode:
- 1998APS..MAR.A1708H