Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions Zavodchikov, V. M. ; Kobzev, A. P. ; Kryuchkov, Yu. Yu. ; Pichugin, V. F. ; Sokhoreva, V. V. ; Frangul'Yan, T. S. Abstract Publication: Technical Physics Letters Pub Date: January 1996 Bibcode: 1996TePhL..22....8Z