Single event upset susceptibilities of latchup immune CMOS process programmable gate arrays
Abstract
Single event upsets (SEU) and latchup susceptibilities of complementary metal oxide semiconductor programmable gate arrays (CMOS PPGA's) were measured at the Lawrence Berkeley Laboratory 88-in. cyclotron facility with Xe (603 MeV), Cu (290 MeV), and Ar (180 MeV) ion beams. The PPGA devices tested were those which may be used in space. Most of the SEU measurements were taken with a newly constructed tester called the Bus Access Storage and Comparison System (BASACS) operating via a Macintosh II computer. When BASACS finds that an output does not match a prerecorded pattern, the state of all outputs, position in the test cycle, and other necessary information is transmitted and stored in the Macintosh. The upset rate was kept between 1 and 3 per second. After a sufficient number of errors are stored, the test is stopped and the total fluence of particles and total errors are recorded. The device power supply current was closely monitored to check for occurrence of latchup. Results of the tests are presented, indicating that some of the PPGA's are good candidates for selected space applications.
- Publication:
-
In Defence Research Establishment
- Pub Date:
- 1991
- Bibcode:
- 1991sre..proc.....K
- Keywords:
-
- Cmos;
- Latch-Up;
- Single Event Upsets;
- Gates (Circuits);
- Ion Beams;
- Performance Tests;
- Nuclear and High-Energy Physics