Precision crystal alignment for high-resolution electron microscope imaging
Abstract
One of the more difficult tasks involved in obtaining quality high-resolution electron micrographs is the precise alignment of a specimen into the required zone. The current accepted procedure, which involves changing to diffraction mode and searching for a symmetric point diffraction pattern, is insensitive to small amounts of misalignment and at best qualitative. On-line analysis of the Fourier space representation of the image, both for determining and correcting crystal tilt, is investigated.
- Publication:
-
Unknown
- Pub Date:
- 1990
- Bibcode:
- 1990pcah.rept.....W
- Keywords:
-
- Alignment;
- Crystals;
- Electron Microscopes;
- High Resolution;
- Image Processing;
- Imaging Techniques;
- Microscopy;
- Diffraction Patterns;
- Fourier Transformation;
- Misalignment;
- On-Line Systems;
- Solid-State Physics