Traps and Deferred Charge in Ccds
Abstract
Defects which collect charge and then release it into subsequent pixels are the major problem facing CCD users and manufacturers. These defects are categorized loosely into three groups: design, material, and processing induced traps. This paper discusses the current state of the understanding of these single pixel defects in terms of both experimental characterization and theoretical modelling.
- Publication:
-
Instrumentation for Ground-Based Optical Astronomy
- Pub Date:
- 1988
- Bibcode:
- 1988igbo.conf..462B