Gate current 1/f noise in GaAs MESFET's Vandamme, L. K. J. ; Rigaud, D. ; Peransin, J. -M. ; Alabedra, R. ; Dumas, J. -M. Abstract Publication: IEEE Transactions on Electron Devices Pub Date: July 1988 DOI: 10.1109/16.3366 Bibcode: 1988ITED...35.1071V