Fault diagnosis of analog circuits
Abstract
Theory and algorithms associated with four main categories of modern techniques used to locate faults in analog circuits are presented. These four general approaches are: the fault dictionary (FDA), the parameter identification (PIA), the fault verification (FVA), and the approximation (AA) approaches. The preliminaries and problems associated with the FDA, such as fault dictionary construction, the methods of optimum measurement selection, fault isolation criteria, and efficient methods of fault simulation, are discussed. The PIA techniques that utilize either linear or nonlinear systems of equations for identification of network elements are examined. Description of the FVA includes node-fault diagnosis, branch-fault diagnosis, subnetwork testability conditions, as well as combinatorial techniques, the failure-bound technique, and the network decomposition technique. In the AA, probabilistic methods and optimization-based methods are considered. In addition, the artificial intelligence technique and the different measures of testability are presented. A series of block diagrams is included.
- Publication:
-
IEEE Proceedings
- Pub Date:
- August 1985
- Bibcode:
- 1985IEEEP..73.1279B
- Keywords:
-
- Analog Circuits;
- Computerized Simulation;
- Electrical Faults;
- Network Analysis;
- Parameter Identification;
- Block Diagrams;
- Dictionaries;
- Direct Current;
- Matrices (Mathematics);
- Optimization;
- Rc Circuits;
- Electronics and Electrical Engineering