Diffraction rotation of the X-ray polarization plane
Abstract
The article reports a theoretical and experimental study of polarization behavior in two-wave Laue diffraction occurring in diffraction rotation of the plane of polarization and manifested in the oscillation of the polarization ratio. The diffraction rotation is attributed to superposition of coherent differentially modulated amplitudes of diffracted waves. The polarization factor is found to be an oscillating function of crystal thickness at the edges. The diffracted beam is partially polarized when the incident beam is completely polarized.
- Publication:
-
Ukrainskii Fizicheskii Zhurnal
- Pub Date:
- January 1977
- Bibcode:
- 1977UkFiZ..22...60M
- Keywords:
-
- Crystallography;
- Laue Method;
- Polarization Characteristics;
- X Ray Diffraction;
- Computer Techniques;
- Copper;
- Crystal Structure;
- Silicon;
- Single Crystals;
- Solid-State Physics