Spin microscope based on optically detected magnetic resonance
Abstract
We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an atomic force microscope, (AFM) scanning tunneling microscope (STM), or near-field scanning optical microscope, and exhibits optically detected magnetic resonance. The proposed spin microscope has nanoscale lateral resolution and the single spin sensitivity for AFM and STM.
- Publication:
-
Journal of Applied Physics
- Pub Date:
- January 2005
- DOI:
- 10.1063/1.1829373
- arXiv:
- arXiv:quant-ph/0405143
- Bibcode:
- 2005JAP....97a4903C
- Keywords:
-
- 07.57.Pt;
- 07.79.Fc;
- 07.79.Lh;
- 07.55.-w;
- 07.60.Pb;
- Submillimeter wave microwave and radiowave spectrometers;
- magnetic resonance spectrometers auxiliary equipment and techniques;
- Near-field scanning optical microscopes;
- Atomic force microscopes;
- Magnetic instruments and components;
- Conventional optical microscopes;
- Quantum Physics
- E-Print:
- 6 pages, 5 figures