Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range
Abstract
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept.
- Publication:
-
Journal of Applied Physics
- Pub Date:
- November 2007
- DOI:
- 10.1063/1.2801027
- arXiv:
- arXiv:physics/0702018
- Bibcode:
- 2007JAP...102i3501V
- Keywords:
-
- 07.77.Ka;
- 07.78.+s;
- 29.25.Bx;
- Charged-particle beam sources and detectors;
- Electron positron and ion microscopes;
- electron diffractometers;
- Electron sources;
- Physics - Accelerator Physics
- E-Print:
- doi:10.1063/1.2801027