Delocalization of flux lines from extended defects by bulk randomness
Abstract
We study the delocalization by bulk randomness of a single flux line (FL) from an extended defect, such as a columnar pin or twin plane. In three dimensions, the FL is always bound to a planar defect, while there is an unpinning transition from a columnar pin. Transfer matrix simulations confirm this picture, and indicate that the divergence of the localization length from the columnar defect is governed by a liberation exponent $\nu_\perp =1.3 \pm 0.6$, for which a ``mean-field'' estimate gives $\nu_\perp \approx 0.78$. The results, and their extensions, are compared to other theories. The effects may be observable in thin samples close to $H_{c1}$.
- Publication:
-
EPL (Europhysics Letters)
- Pub Date:
- September 1993
- DOI:
- 10.1209/0295-5075/23/7/007
- arXiv:
- arXiv:cond-mat/9303015
- Bibcode:
- 1993EL.....23..503B
- Keywords:
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- Condensed Matter
- E-Print:
- 5 pages, 3 figures available upon request,REVTeX 3.0