Full-potential multiple scattering for x-ray spectroscopies
Abstract
We present a full-potential multiple scattering (FPMS) scheme for the interpretation of several x-ray spectroscopies that is a straightforward generalization of the more conventional muffin-tin version. Like this latter, it preserves the intuitive description of the physical process under consideration and overcomes some of the limitations of the existing FPMS codes. It hinges on a fast and efficient method for solving the single-cell scattering problem that avoids the convergence drawbacks of the angular momentum expansion of the cell shape function; it relies on an alternative derivation of the multiple scattering equations that allows us to work reliably with only one truncation parameter, i.e., the number of local basis functions in the expansion of the global scattering function determined by the classical relation lmax∼kR .
- Publication:
-
Physical Review B
- Pub Date:
- August 2007
- DOI:
- 10.1103/PhysRevB.76.060102
- arXiv:
- arXiv:cond-mat/0702528
- Bibcode:
- 2007PhRvB..76f0102H
- Keywords:
-
- 61.14.Qp;
- 61.10.Ht;
- 71.15.Ap;
- X-ray photoelectron diffraction;
- X-ray absorption spectroscopy: EXAFS NEXAFS XANES etc.;
- Basis sets and related methodology;
- Condensed Matter - Materials Science
- E-Print:
- 4 pages 2 figures