Four-point measurements of n- and p-type two-dimensional systems fabricated with cleaved-edge overgrowth
Abstract
We demonstrate a contact design that allows four-terminal magnetotransport measurements of cleaved-edge overgrown two-dimensional electron and hole systems. By lithographically patterning and etching a bulk-doped surface layer, finger-shaped leads are fabricated, which contact the two-dimensional systems on the cleave facet. Both n- and p-type two-dimensional systems are demonstrated at the cleaved edge, using Si as either donor or acceptor, dependent on the growth conditions. Four-point measurements of both gated and modulation-doped samples yield fractional quantum Hall features for both n and p types, with several higher-order fractions evident in n-type modulation-doped samples.
- Publication:
-
Applied Physics Letters
- Pub Date:
- November 2005
- DOI:
- arXiv:
- arXiv:cond-mat/0511057
- Bibcode:
- 2005ApPhL..87u2113G
- Keywords:
-
- 72.20.My;
- 73.21.-b;
- 81.16.Rf;
- 85.40.Hp;
- 81.65.Cf;
- 73.43.-f;
- Galvanomagnetic and other magnetotransport effects;
- Electron states and collective excitations in multilayers quantum wells mesoscopic and nanoscale systems;
- Nanoscale pattern formation;
- Lithography masks and pattern transfer;
- Surface cleaning etching patterning;
- Quantum Hall effects;
- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- 3 pages, 3 figures