Characterization of high-quality MgB2(0001) epitaxial films on Mg(0001)
Abstract
High-grade MgB2(0001) films were grown on Mg(0001) by means of ultra-high-vacuum molecular beam epitaxy. Low-energy electron diffraction and x-ray diffraction data indicate that thick films are formed by epitaxially oriented grains with MgB2 bulk structure. The quality of the films allowed angle-resolved photoemission and polarization dependent x-ray absorption measurements. For the first time, we report the band mapping along the Γ-A direction and the estimation of the electron-phonon coupling constant λ = 0.55 ± 0.06 for the surface state electrons.
- Publication:
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New Journal of Physics
- Pub Date:
- January 2006
- DOI:
- 10.1088/1367-2630/8/1/012
- arXiv:
- arXiv:cond-mat/0509181
- Bibcode:
- 2006NJPh....8...12P
- Keywords:
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- Condensed Matter - Materials Science;
- Condensed Matter - Superconductivity
- E-Print:
- 15 text pages, 6 figures Submitted for publication