Simultaneous current-, force-, and work-function measurement with atomic resolution
Abstract
The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work-function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work-function measurements on a silicon (111)-(7×7) surface are presented and related to concurrently recorded tunneling current and force measurements.
- Publication:
-
Applied Physics Letters
- Pub Date:
- April 2005
- DOI:
- 10.1063/1.1900316
- arXiv:
- arXiv:cond-mat/0501469
- Bibcode:
- 2005ApPhL..86o3101H
- Keywords:
-
- 68.37.Ef;
- 68.47.Fg;
- 68.37.Ps;
- Scanning tunneling microscopy;
- Semiconductor surfaces;
- Atomic force microscopy;
- Condensed Matter - Materials Science
- E-Print:
- 8 pages, 4 figures, submitted to Applied Physics Letters