Anomalous layering at the liquid Sn surface
Abstract
X-ray reflectivity measurements on the free surface of liquid Sn are presented. They exhibit the high-angle peak, indicative of surface-induced layering, also found for other pure liquid metals (Hg, Ga, and In). However, a low-angle shoulder, not hitherto observed for any pure liquid metal, is also found, indicating the presence of a high-density surface layer. Fluorescence and resonant reflectivity measurements rule out the assignment of this layer to surface segregation of impurities. The reflectivity is modeled well by a 10% contraction of the spacing between the first and second atomic surface layers, relative to that of subsequent layers. Possible reasons for this are discussed.
- Publication:
-
Physical Review B
- Pub Date:
- December 2004
- DOI:
- 10.1103/PhysRevB.70.224206
- arXiv:
- arXiv:cond-mat/0406583
- Bibcode:
- 2004PhRvB..70v4206S
- Keywords:
-
- 61.10.-i;
- 61.25.Mv;
- 68.03.Hj;
- X-ray diffraction and scattering;
- Liquid metals and alloys;
- Structure: measurements and simulations;
- Condensed Matter - Statistical Mechanics;
- Condensed Matter - Materials Science
- E-Print:
- 8 pages, 9 figures