Zero-bias anomalies in electrochemically fabricated nanojunctions
Abstract
A streamlined technique for the electrochemical fabrication of metal nanojunctions (MNJs) between lithographically defined electrodes is presented. The first low-temperature transport measurements in such structures reveal suppression of the conductance near zero bias. The size of the zero-bias anomaly (ZBA) depends strongly on the fabrication electrochemistry and the dimensions of the resulting MNJ. We present evidence that the nonperturbative ZBA in atomic-scale junctions is due to a density of states suppression in the leads.
- Publication:
-
Applied Physics Letters
- Pub Date:
- April 2003
- DOI:
- 10.1063/1.1565678
- arXiv:
- arXiv:cond-mat/0307549
- Bibcode:
- 2003ApPhL..82.2332Y
- Keywords:
-
- 73.40.Ns;
- 73.63.Rt;
- 81.07.Lk;
- 73.20.At;
- 85.40.Hp;
- Metal-nonmetal contacts;
- Nanoscale contacts;
- Nanocontacts;
- Surface states band structure electron density of states;
- Lithography masks and pattern transfer;
- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- 4 pages, 4 figures