Model of transport nonuniversality in thick-film resistors
Abstract
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances.
- Publication:
-
Applied Physics Letters
- Pub Date:
- July 2003
- DOI:
- arXiv:
- arXiv:cond-mat/0307141
- Bibcode:
- 2003ApPhL..83..189G
- Keywords:
-
- 84.32.Ff;
- 85.40.Xx;
- Conductors resistors;
- Hybrid microelectronics;
- thick films;
- Condensed Matter - Disordered Systems and Neural Networks;
- Condensed Matter - Materials Science
- E-Print:
- 3 pages, 1 figure