Hole doping dependence of the coherence length in La2 - xSrxCuO4 thin films

By measuring the field and temperature dependence of magnetization on systematically doped La_{2 - x}Sr_xCuO₄ thin films, the critical current density j_c(0) and the collective pinning energy U_p(0) are determined in single-vortex creep regime. Together with the published data of superfluid density, condensation energy and anisotropy, for the first time we derive the doping dependence of the coherence length or vortex core size in wide-doping regime directly from the low-temperature data. It is found that the coherence length drops in the underdoped region and increases in the overdoped side with the increase of hole concentration. The result in the underdoped region clearly prevents from taking the pseudogap energy scale as the upper critical field.