Critical Current of YBa2Cu3O7-δ Low-Angle Grain Boundaries

Transport critical current measurements have been performed on 5° [001]-tilt thin film YBa₂Cu₃O_7-δ single grain boundaries with the magnetic field rotated in the plane of the film, φ. The variation of the critical current has been determined as a function of the angle between the magnetic field and the grain boundary plane. In applied fields above 1T the critical current j_c is found to be strongly suppressed only when the magnetic field is within an angle φ_k of the grain boundary. Outside this angular range the behavior of the artificial grain boundary is dominated by the critical current of the grains. We show that the φ dependence of j_c in the suppressed region is well described by a flux cutting model.