Intersubband absorption linewidth in GaAs quantum wells due to scattering by interface roughness, phonons, alloy disorder, and impurities
Abstract
We calculate the intersubband absorption linewidth 2Γop in quantum wells (QWs) due to scattering by interface roughness, LO phonons, LA phonons, alloy disorder, and ionized impurities, and compare it with the transport energy broadening 2Γtr=2ℏ/τtr, which corresponds to the transport relaxation time τtr related to the electron mobility μ. Numerical calculations for GaAs QWs clarify the different contributions of each individual scattering mechanism to the absorption linewidth 2Γop and transport broadening 2Γtr. Interface roughness scattering contributes about an order of magnitude more to the linewidth 2Γop than to the transport broadening 2Γtr, because the contribution from the intrasubband scattering in the first excited subband is much larger than that in the ground subband. On the other hand, LO phonon scattering (at room temperature) and ionized impurity scattering contribute much less to the linewidth 2Γop than to the transport broadening 2Γtr. LA phonon scattering makes comparable contributions to the linewidth 2Γop and transport broadening 2Γtr, and so does alloy disorder scattering. The combination of these contributions with significantly different characteristics makes the absolute values of the linewidth 2Γop and transport broadening 2Γtr very different, and leads to the apparent lack of correlation between them when a parameter, such as temperature or alloy composition, is changed. Our numerical calculations can quantitatively explain the previously reported experimental results.
- Publication:
-
Journal of Applied Physics
- Pub Date:
- February 2003
- DOI:
- 10.1063/1.1535733
- arXiv:
- arXiv:cond-mat/0208195
- Bibcode:
- 2003JAP....93.1586U
- Keywords:
-
- 78.67.De;
- 73.63.Hs;
- 81.07.St;
- 81.05.Ea;
- 68.65.Fg;
- 73.21.Fg;
- 68.35.Ct;
- 72.10.Di;
- 72.10.Fk;
- 73.25.+i;
- 71.38.-k;
- 73.50.Gr;
- 73.50.Dn;
- Quantum wells;
- III-V semiconductors;
- Interface structure and roughness;
- Scattering by phonons magnons and other nonlocalized excitations;
- Scattering by point defects dislocations surfaces and other imperfections;
- Surface conductivity and carrier phenomena;
- Polarons and electron-phonon interactions;
- Charge carriers: generation recombination lifetime trapping mean free paths;
- Low-field transport and mobility;
- piezoresistance;
- Condensed Matter
- E-Print:
- 17 pages, including 15 figures