Simultaneous mapping of the ultrafast time and fluence dependence of the laser-induced insulator-to-metal transition in magnetite

Pump-probe methods are a ubiquitous tool in the field of ultrafast dynamic measurements. In recent years, X-ray free-electron laser experiments have gained importance due to their ability to probe with high chemical selectivity and at atomic length scales. To obtain the complete dynamic information, measurements are typically repeated many thousands of times with varying delay and/or fluence settings. This generally necessitates that the sample fully recovers before the subsequent excitation and that probe pulses and the induced dynamic evolution are comparable to each other. These conditions present a significant challenge when the sample fluctuates between different initial states or when it is susceptible to damage. Also, source fluctuations are normally intrinsic to free-electron laser pulses. Here, we present a time-to-space mapping imaging scheme that enables us to record a delay range of several picoseconds as well as a laser fluence range of about one order of magnitude in every single shot of the x-ray probe. This approach can circumvent the aforementioned preconditions. We demonstrate the use of this scheme by mapping the femto- and picosecond dynamics of the optically induced insulator-to-metal Verwey transition in a magnetite thin film. We employ resonant diffraction at the free-electron laser FLASH for probing. The dynamics of the magnetite thin film are found to follow a biexponential decay in line with earlier studies on bulk crystals. By extrapolating our results towards the conditions found at X-ray free-electron lasers with higher energy, we demonstrate that the presented data could be recorded in a single shot.