Modeling and Analysis of Spatial and Temporal Land Clutter Statistics in SAR Imaging Based on MSTAR Data
Abstract
The statistical analysis of land clutter for Synthetic Aperture Radar (SAR) imaging has become an increasingly important subject for research and investigation. It is also absolutely necessary for designing robust algorithms capable of performing the task of target detection in the background clutter. Any attempt to extract the energy of the desired targets from the land clutter requires complete knowledge of the statistical properties of the background clutter. In this paper, the spatial as well as the temporal characteristics of the land clutter are studied. Since the data for each image has been collected based on a different aspect angle; therefore, the temporal analysis contains variation in the aspect angle. Consequently, the temporal analysis includes the characteristics of the radar cross section with respect to the aspect angle based on which the data has been collected. In order to perform the statistical analysis, several well-known and relevant distributions, namely, Weibull, Log-normal, Gamma, and Rayleigh are considered as prime candidates to model the land clutter. The goodness-of-fit test is based on the Kullback-Leibler (KL) Divergence metric. The detailed analysis presented in this paper demonstrates that the Weibull distribution is a more accurate fit for the temporal-aspect-angle statistical analysis while the Rayleigh distribution models the spatial characteristics of the background clutter with higher accuracy. Finally, based on the aforementioned statistical analyses and by utilizing the Constant False Alarm Rate (CFAR) algorithm, we perform target detection in land clutter. The overall verification of the analysis is performed by exploiting the Moving and Stationary Target Acquisition and Recognition (MSTAR) data-set, which has been collected in spotlight mode at X-band, and the results are presented.
- Publication:
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arXiv e-prints
- Pub Date:
- October 2024
- DOI:
- 10.48550/arXiv.2410.03816
- arXiv:
- arXiv:2410.03816
- Bibcode:
- 2024arXiv241003816H
- Keywords:
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- Computer Science - Computer Vision and Pattern Recognition;
- Electrical Engineering and Systems Science - Signal Processing;
- Statistics - Applications
- E-Print:
- arXiv admin note: substantial text overlap with arXiv:2409.02155