AEMIM: Adversarial Examples Meet Masked Image Modeling
Abstract
Masked image modeling (MIM) has gained significant traction for its remarkable prowess in representation learning. As an alternative to the traditional approach, the reconstruction from corrupted images has recently emerged as a promising pretext task. However, the regular corrupted images are generated using generic generators, often lacking relevance to the specific reconstruction task involved in pre-training. Hence, reconstruction from regular corrupted images cannot ensure the difficulty of the pretext task, potentially leading to a performance decline. Moreover, generating corrupted images might introduce an extra generator, resulting in a notable computational burden. To address these issues, we propose to incorporate adversarial examples into masked image modeling, as the new reconstruction targets. Adversarial examples, generated online using only the trained models, can directly aim to disrupt tasks associated with pre-training. Therefore, the incorporation not only elevates the level of challenge in reconstruction but also enhances efficiency, contributing to the acquisition of superior representations by the model. In particular, we introduce a novel auxiliary pretext task that reconstructs the adversarial examples corresponding to the original images. We also devise an innovative adversarial attack to craft more suitable adversarial examples for MIM pre-training. It is noted that our method is not restricted to specific model architectures and MIM strategies, rendering it an adaptable plug-in capable of enhancing all MIM methods. Experimental findings substantiate the remarkable capability of our approach in amplifying the generalization and robustness of existing MIM methods. Notably, our method surpasses the performance of baselines on various tasks, including ImageNet, its variants, and other downstream tasks.
- Publication:
-
arXiv e-prints
- Pub Date:
- July 2024
- DOI:
- 10.48550/arXiv.2407.11537
- arXiv:
- arXiv:2407.11537
- Bibcode:
- 2024arXiv240711537X
- Keywords:
-
- Computer Science - Computer Vision and Pattern Recognition;
- Computer Science - Artificial Intelligence
- E-Print:
- Under review of International Journal of Computer Vision (IJCV)