Effective medium theory for the electrical conductance of random resistor networks which mimic crack-template-based transparent conductive films
Abstract
We studied random resistor networks produced with regular structure and random distribution of edge conductances. These networks are intended to mimic crack-template-based transparent conductive films as well some random networks produced using nano-imprinting technology. Applying an effective medium theory, we found out that the electrical conductance of such networks is $\approx 0.5852 \sqrt{n_E}$, where $n_E$ is the number density of conductive edges. This dependence is in agreement with numerical calculations in Voronoi networks, although the effective conductances are approximately 15\% larger.
- Publication:
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arXiv e-prints
- Pub Date:
- March 2024
- DOI:
- 10.48550/arXiv.2403.10241
- arXiv:
- arXiv:2403.10241
- Bibcode:
- 2024arXiv240310241T
- Keywords:
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- Condensed Matter - Disordered Systems and Neural Networks;
- Condensed Matter - Statistical Mechanics
- E-Print:
- 7 pages, 4 figures, 1 table, 68 references