SpeckleNN: a unified embedding for real-time speckle pattern classification in X-ray single-particle imaging with limited labeled examples
Abstract
This paper presents a neural network model called SpeckleNN for real-time classification of X-ray single-particle imaging (SPI) speckle patterns, ideal for use in high-data-rate facilities like the European XFEL and LCLS-II-HE. It possesses the capability to carry out few-shot classification on novel samples and demonstrates robust performance even in the presence of substantial missing detector area, rendering it an excellent candidate for real-time high-throughput SPI experiments.
- Publication:
-
IUCrJ
- Pub Date:
- July 2023
- DOI:
- 10.1107/S2052252523006115
- arXiv:
- arXiv:2302.06895
- Bibcode:
- 2023IUCrJ..10..568W
- Keywords:
-
- SpeckleNN;
- coherent X-ray diffractive imaging;
- CXDI;
- X-ray free-electron lasers;
- single-particle imaging;
- viruses;
- speckle patterns;
- Computer Science - Machine Learning