Modelling fine-sliced three dimensional electron diffraction data with dynamical Bloch-wave simulations
Abstract
Fine-sliced cRED data allows dynamical electron scattering to be investigated with high precision. Experimental and simulated data are compared for single-crystal silicon, showing the importance of accurate crystal orientation and many other corrections for obtaining good measurement statistics.
- Publication:
-
IUCrJ
- Pub Date:
- January 2023
- DOI:
- 10.1107/S2052252522011290
- arXiv:
- arXiv:2208.09531
- Bibcode:
- 2023IUCrJ..10..118C
- Keywords:
-
- 3D electron diffraction;
- 3D-ED;
- dynamical refinement;
- computational modelling;
- dynamical simulations;
- Physics - Computational Physics