Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples-Kinetics of Photocurrent (PC)
Abstract
Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, μτ. We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the space charge distribution. The PC-V characteristics obtained for ħω > Eg and ħω ~ Eg indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the results of measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The measurements of PC-V characteristics for ħω > Eg may test the detector plate surface quality.
- Publication:
-
Sensors
- Pub Date:
- April 2022
- DOI:
- 10.3390/s22082941
- arXiv:
- arXiv:2202.10990
- Bibcode:
- 2022Senso..22.2941M
- Keywords:
-
- CdMnTe;
- surface defects;
- etching;
- carrier mobility-lifetime product;
- Condensed Matter - Materials Science;
- Physics - Applied Physics
- E-Print:
- 16 pages, 13 figures