High-Throughput and Energy-Efficient VLSI Architecture for Ordered Reliability Bits GRAND
Abstract
Ultra-reliable low-latency communication (URLLC), a major 5G New-Radio use case, is the key enabler for applications with strict reliability and latency requirements. These applications necessitate the use of short-length and high-rate codes. Guessing Random Additive Noise Decoding (GRAND) is a recently proposed Maximum Likelihood (ML) decoding technique for these short-length and high-rate codes. Rather than decoding the received vector, GRAND tries to infer the noise that corrupted the transmitted codeword during transmission through the communication channel. As a result, GRAND can decode any code, structured or unstructured. GRAND has hard-input as well as soft-input variants. Among these variants, Ordered Reliability Bits GRAND (ORBGRAND) is a soft-input variant that outperforms hard-input GRAND and is suitable for parallel hardware implementation. This work reports the first hardware architecture for ORBGRAND, which achieves an average throughput of up to $42.5$ Gbps for a code length of $128$ at a target FER of $10^{-7}$. Furthermore, the proposed hardware can be used to decode any code as long as the length and rate constraints are met. In comparison to the GRANDAB, a hard-input variant of GRAND, the proposed architecture enhances decoding performance by at least $2$ dB. When compared to the state-of-the-art fast dynamic successive cancellation flip decoder (Fast-DSCF) using a 5G polar $(128,105)$ code, the proposed ORBGRAND VLSI implementation has $49\times$ higher average throughput, $32\times$ times more energy efficiency, and $5\times$ more area efficiency while maintaining similar decoding performance.
- Publication:
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arXiv e-prints
- Pub Date:
- October 2021
- DOI:
- 10.48550/arXiv.2110.13776
- arXiv:
- arXiv:2110.13776
- Bibcode:
- 2021arXiv211013776M
- Keywords:
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- Computer Science - Information Theory
- E-Print:
- Accepted for inclusion in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2022. For the updated version, please see IEEE Xplore