A capacitive displacement system for studying the piezoelectric strain and its temperature variation
Abstract
A capacitive displacement system was constructed to measure the electric-field-induced piezoelectric strain in the simple form of either a bulk or thin film. The system can determine an AC displacement of 2 pm precisely by using a lock-in detection and can measure the large displacement within the range of ± 25 μ m with a sub-nanometer resolution. The system can also be used to measure the variation in strain within the temperature range of 210-450 K, allowing the evaluation of the temperature coefficient of a piezoelectric constant and the studies on the effects of a phase transition on the piezoelectric response. Experimental results on quartz, Pb ( Zr 1 − x Ti x ) TiO 3 ceramics and thin films, and BaTiO 3 confirm the capabilities of the developed system.
- Publication:
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Journal of Applied Physics
- Pub Date:
- April 2021
- DOI:
- 10.1063/5.0040541
- arXiv:
- arXiv:2104.02211
- Bibcode:
- 2021JAP...129n4101F
- Keywords:
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- Condensed Matter - Materials Science
- E-Print:
- 11 pages, 8 figures