Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X Rays
Abstract
Dynamical diffraction effects in thin single crystals produce highly monochromatic parallel x-ray beams with a mutual separation of a few microns and a time delay of a few femtoseconds—the so-called echoes. This ultrafast diffraction effect is used at X-Ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent x-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step toward the ambitious goal of strain tailoring new x-ray optics and, conversely, open up the possibility of using ultrafast dynamical diffraction effects to study strain in materials.
- Publication:
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Physical Review Letters
- Pub Date:
- October 2021
- DOI:
- 10.1103/PhysRevLett.127.157402
- arXiv:
- arXiv:2012.08893
- Bibcode:
- 2021PhRvL.127o7402R
- Keywords:
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- Physics - Optics;
- Condensed Matter - Materials Science;
- Physics - Applied Physics;
- Physics - Instrumentation and Detectors
- E-Print:
- Phys. Rev. Lett. 127, 157402 (2021)