Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Abstract
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
- Publication:
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arXiv e-prints
- Pub Date:
- August 2020
- DOI:
- 10.48550/arXiv.2008.12768
- arXiv:
- arXiv:2008.12768
- Bibcode:
- 2020arXiv200812768P
- Keywords:
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- Physics - Computational Physics;
- Mathematics - Optimization and Control
- E-Print:
- Phys. Rev. Research 3, 023159 (2021)