Classification with Quantum Measurements
Abstract
This paper reports a novel method for supervised machine learning based on the mathematical formalism that supports quantum mechanics. The method uses projective quantum measurement as a way of building a prediction function. Specifically, the relationship between input and output variables is represented as the state of a bipartite quantum system. The state is estimated from training samples through an averaging process that produces a density matrix. Prediction of the label for a new sample is made by performing a projective measurement on the bipartite system with an operator, prepared from the new input sample, and applying a partial trace to obtain the state of the subsystem representing the output. The method can be seen as a generalization of Bayesian inference classification and as a type of kernel-based learning method. One remarkable characteristic of the method is that it does not require learning any parameters through optimization. We illustrate the method with different 2-D classification benchmark problems and different quantum information encodings.
- Publication:
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Journal of the Physical Society of Japan
- Pub Date:
- April 2021
- DOI:
- 10.7566/JPSJ.90.044002
- arXiv:
- arXiv:2004.01227
- Bibcode:
- 2021JPSJ...90d4002G
- Keywords:
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- Quantum Physics;
- Computer Science - Machine Learning
- E-Print:
- Supplementary material integrated into main text. Typos corrected