Rethinking Few-Shot Image Classification: a Good Embedding Is All You Need?
Abstract
The focus of recent meta-learning research has been on the development of learning algorithms that can quickly adapt to test time tasks with limited data and low computational cost. Few-shot learning is widely used as one of the standard benchmarks in meta-learning. In this work, we show that a simple baseline: learning a supervised or self-supervised representation on the meta-training set, followed by training a linear classifier on top of this representation, outperforms state-of-the-art few-shot learning methods. An additional boost can be achieved through the use of self-distillation. This demonstrates that using a good learned embedding model can be more effective than sophisticated meta-learning algorithms. We believe that our findings motivate a rethinking of few-shot image classification benchmarks and the associated role of meta-learning algorithms. Code is available at: http://github.com/WangYueFt/rfs/.
- Publication:
-
arXiv e-prints
- Pub Date:
- March 2020
- DOI:
- 10.48550/arXiv.2003.11539
- arXiv:
- arXiv:2003.11539
- Bibcode:
- 2020arXiv200311539T
- Keywords:
-
- Computer Science - Computer Vision and Pattern Recognition;
- Computer Science - Machine Learning
- E-Print:
- First two authors contributed equally. Project Page: https://people.csail.mit.edu/yuewang/projects/rfs/ Code: http://github.com/WangYueFt/rfs/