Super-resolution SAXS based on PSF engineering and sub-pixel detector translations
Abstract
Small-angle X-ray scattering (SAXS) technique enables convenient nanoscopic characterization for various systems and conditions. Nonetheless, lab-based SAXS systems intrinsically suffer from insufficient x-ray flux and limited angular resolution. Here, we develop a two-step reconstruction methodology to enhance the angular resolution for given experimental conditions. Using minute hardware additions, we show that translating the x-ray detector in subpixel steps and modifying the incoming beam shape results in a set of 2D scattering images which is sufficient for super-resolution SAXS reconstruction. The technique is verified experimentally to show above 25\% increase in resolution. Such advantages have a direct impact on the ability to resolve faster and finer nanoscopic structures and can be implemented in most existing SAXS apparatuses.
- Publication:
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arXiv e-prints
- Pub Date:
- February 2020
- DOI:
- 10.48550/arXiv.2002.12665
- arXiv:
- arXiv:2002.12665
- Bibcode:
- 2020arXiv200212665G
- Keywords:
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- Physics - Instrumentation and Detectors;
- Condensed Matter - Mesoscale and Nanoscale Physics;
- Physics - Applied Physics
- E-Print:
- submitted to Journal of Applied Crystallography on Feb, 16th 2020