Evaluating the Transferability and Adversarial Discrimination of Convolutional Neural Networks for Threat Object Detection and Classification within X-Ray Security Imagery
Abstract
X-ray imagery security screening is essential to maintaining transport security against a varying profile of threat or prohibited items. Particular interest lies in the automatic detection and classification of weapons such as firearms and knives within complex and cluttered X-ray security imagery. Here, we address this problem by exploring various end-to-end object detection Convolutional Neural Network (CNN) architectures. We evaluate several leading variants spanning the Faster R-CNN, Mask R-CNN, and RetinaNet architectures to explore the transferability of such models between varying X-ray scanners with differing imaging geometries, image resolutions and material colour profiles. Whilst the limited availability of X-ray threat imagery can pose a challenge, we employ a transfer learning approach to evaluate whether such inter-scanner generalisation may exist over a multiple class detection problem. Overall, we achieve maximal detection performance using a Faster R-CNN architecture with a ResNet$_{101}$ classification network, obtaining 0.88 and 0.86 of mean Average Precision (mAP) for a three-class and two class item from varying X-ray imaging sources. Our results exhibit a remarkable degree of generalisability in terms of cross-scanner performance (mAP: 0.87, firearm detection: 0.94 AP). In addition, we examine the inherent adversarial discriminative capability of such networks using a specifically generated adversarial dataset for firearms detection - with a variable low false positive, as low as 5%, this shows both the challenge and promise of such threat detection within X-ray security imagery.
- Publication:
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arXiv e-prints
- Pub Date:
- November 2019
- DOI:
- 10.48550/arXiv.1911.08966
- arXiv:
- arXiv:1911.08966
- Bibcode:
- 2019arXiv191108966G
- Keywords:
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- Computer Science - Computer Vision and Pattern Recognition;
- Computer Science - Machine Learning;
- Electrical Engineering and Systems Science - Image and Video Processing