Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles
Abstract
In the supporting information file of the article Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles (Crystal Growth & Design 2019), there is a description on how to use Scherrer equation for in situ X-ray diffraction analysis of crystallization processes investigated in the article. That description led to a necessary revaluation on the current understanding of the usage of Scherrer equation for analyzing size distributions, as discussed in this work.
- Publication:
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arXiv e-prints
- Pub Date:
- November 2019
- DOI:
- 10.48550/arXiv.1911.00701
- arXiv:
- arXiv:1911.00701
- Bibcode:
- 2019arXiv191100701V
- Keywords:
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- Condensed Matter - Materials Science
- E-Print:
- 9 pages, 3 figures, 11 references