Regression Networks for Meta-Learning Few-Shot Classification
Abstract
We propose regression networks for the problem of few-shot classification, where a classifier must generalize to new classes not seen in the training set, given only a small number of examples of each class. In high dimensional embedding spaces the direction of data generally contains richer information than magnitude. Next to this, state-of-the-art few-shot metric methods that compare distances with aggregated class representations, have shown superior performance. Combining these two insights, we propose to meta-learn classification of embedded points by regressing the closest approximation in every class subspace while using the regression error as a distance metric. Similarly to recent approaches for few-shot learning, regression networks reflect a simple inductive bias that is beneficial in this limited-data regime and they achieve excellent results, especially when more aggregate class representations can be formed with multiple shots.
- Publication:
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arXiv e-prints
- Pub Date:
- May 2019
- DOI:
- 10.48550/arXiv.1905.13613
- arXiv:
- arXiv:1905.13613
- Bibcode:
- 2019arXiv190513613D
- Keywords:
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- Computer Science - Machine Learning;
- Computer Science - Computer Vision and Pattern Recognition;
- Statistics - Machine Learning
- E-Print:
- 7th ICML Workshop on Automated Machine Learning (2020)